Measurement of Elastic Constant and Refraction Index of Thin Films at Low Temperatures Using Picosecond Ultrasound
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概要
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In this paper, a picosecond ultrasound measurement is conducted to evaluate the low-temperature elastic and optical properties of thin films and semiconductors. Specimens are cooled with liquid He through a heat exchanger in a cryostat, and an ultrahigh-frequency acoustic pulse is generated using a femtosecond light pulse, which propagates in the film-thickness direction. Pulse echoes of the longitudinal wave and Brillouin oscillation are observed by the changes in reflectivity of the time-delayed probe light, which depend on the material, and give the longitudinal-wave out-of-plane elastic constant. When the stiffness is known, the Brillouin oscillation provides the refractive index. We determined the stiffness of a Pt thin film and the refractive index of Si at 5 K. The methodology developed in this paper is useful for studing the elastic and optical properties of metallic thin films and transparent materials at cryogenic temperatures.
- 2010-07-25
著者
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Ogi Hirotsugu
Graduate School Of Engineering Science Osaka University
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Hirao Masahiko
Graduate School Of Engineering Sci. Osaka Univ.
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Nakamura Nobutomo
Graduate School Of Engineering Science Osaka University
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Tanigaki Kenichi
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
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Kusumoto Tatsuya
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
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Nakamura Nobutomo
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
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