GaN Nanowires with $\text{Au}+\text{Ga}$ Solid Solution Grown on an Si(111) Substrate by Metalorganic Chemical Vapor Deposition
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概要
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In this study, gallium nitride (GaN) nanowire (NW) arrays were grown on a gold-coated Si(111) substrate by metalorganic chemical vapor deposition (MOCVD). The important parameter that decides the density of GaN NWs was considered to be growth temperature. Therefore, in order to study the effect of growth temperature, we grew GaN NWs at various growth temperatures, namely, 800, 850, 900, 950, and 1000 °C, under identical growth conditions. The optimum growth temperature was observed to be 950 °C, and the diameters of the grown GaN NWs were in the range from 80 to 250 nm, and the average length was 3 μm. The surface morphology and optical characterization of the grown GaN NWs were studied by field emission scanning electron microscope (FE-SEM), photoluminescence (PL), and cathodoluminescence (CL), respectively. Energy dispersive X-ray spectroscopy (EDX) analysis confirmed the presence of gallium and nitrogen in the grown NWs. The PL and CL spectra revealed sharp peaks at 366 nm with a full width at half maximum (FWHM) of 102 meV and at 3.36 eV with a FWHM of 85 meV, respectively, indicating that the grown GaN NWs were highly crystalline.
- 2009-09-25
著者
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Kim Jin-soo
School Of Advanced Materials Engineering Engineering College Chonbuk National University
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Kim Dong-wook
School Of Advanced Materials Engineering Engineering College Chonbuk National University
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Jang Eun-su
School Of Advanced Materials Engineering Engineering College Chonbuk National University
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Lee In-hwan
School Of Advanced Materials Engineering And Research Center For Advanced Materials Development Chon
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Lee Cheul-ro
School Of Advanced Materials Engineering And Research Center Of Advanced Materials Development Chonb
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Lee In-Hwan
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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Ra Yong-Ho
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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Lee Young-Min
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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Yun Seok-Hyo
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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Navamathavan R.
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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Kim Dong-Wook
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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Kim Jin-Soo
School of Advanced Materials Engineering, Engineering College, Research Center for Advanced Materials Development (RCAMD), Chonbuk National University, 664-14 Deokjin-dong, Deokjin-gu, Chonju 561-756, Republic of Korea
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