Effect of Crystal Structure on Microwave Dielectric Properties of (Ni1/3B2/3)1-xTixO2 ($\text{B}=\text{Nb}$ and Ta)

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Dependence of microwave dielectric properties on the crystal structure of (Ni1/3B2/3)1-xTixO2 ($\text{B$^{5+}$}=\text{Nb}$, Ta, $0.3\leq x\leq 0.6$) were investigated. Single phase of tetragonal rutile structure was detected through the entire range of compositions ($0.3\leq x\leq 0.6$). Dielectric constant ($K$) and the temperature coefficient of resonant frequency ($\mathit{TCF}$) of (Ni1/3B2/3)1-xTixO2 ($\text{B$^{5+}$}=\text{Nb}$, Ta) increased with an increase of TiO2 content due to the increase of bond length ratio of ($d_{\text{apical}})/(d_{\text{equatorial}}$), and the octahedral distortion of rutile structure, respectively. The specimens with smaller Ti content and/or $\text{B$^{5+}$}=\text{Ta}$ showed larger $Q f$ value than those with larger Ti content and/or $\text{B$^{5+}$}=\text{Nb}$.
2007-10-30