Measurement of the True Value of the Carrier-Envelope Phase of a Few-Cycle Laser Pulse by the Interference between Second and Third Harmonics from the Surface of a Solid
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概要
- 論文の詳細を見る
We demonstrate a measurement that provides the true value of the carrier-envelope phase using a few-cycle laser pulse. The measurement is based on the interference between the second and third harmonics from the surface of a solid. The interference intensity is sensitive to the carrier-envelope phase. This result for low-energy pulses will lead to a new technique for measuring the carrier-envelope phase.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-05-15
著者
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Ishizawa Atsushi
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corp.
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Nakano Hidetoshi
Ntt Basic Research Laboratories
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Nakano Hidetoshi
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Ishizawa Atsushi
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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