The Novel Deflector for Multi Arrayed Microcolumn Using Microelectromechanical System (MEMS) Technology
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概要
- 論文の詳細を見る
This paper describes a new concept for a multiple arrayed deflector with a reduced amount of wiring by utilizing a fabrication technique using microelectromechanical system (MEMS) technology, such as multi wafer anodic bonding techniques and copper electroplating in order to produce a double layer structure. The double layer interconnection structure is a newly introduced interconnection method that reduces wiring among the components. A $3\times 3$ arrayed deflector, which has an internal wiring structure, was fabricated. The deflection performance of the newly fabricated deflector displayed linear deflection results. Moreover, the difference in the signal delay between each deflector pole, which was caused by multiple interconnection structures, was calculated using a simulation program with integrated circuit emphasis (SPICE) simulator with an equivalent circuit model. The calculation results showed there was an approximate 3 ns signal delay difference. Therefore, this method is very useful for checking the difference in the signal delay. This work will be helpful for understanding the interconnections a multiple arrayed microcolumn system.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-06-15
著者
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Chun Kukjin
School Of Electrical Engineering And Computer Science #038 And Inter-university Semiconductor Resear
-
Kim Hak
School Of Electrical Engineering And Computer Science #038 And Inter-university Semiconductor Resear
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HAN Changho
School of Electrical Engineering and Computer Science #038 and Inter-university Semiconductor Resear
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Chun Kukjin
School of Electrical Engineering and Computer Science #038 and Inter-university Semiconductor Research Center, Seoul National University, Kwanak P. O. Box 34, Seoul 151-742, Korea
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Han Changho
School of Electrical Engineering and Computer Science #038 and Inter-university Semiconductor Research Center, Seoul National University, Kwanak P. O. Box 34, Seoul 151-742, Korea
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