Application of Characteristic Secondary Ion Mass Spectra to a Depth Analysis of Iron Aluminum Oxide
スポンサーリンク
概要
- 論文の詳細を見る
Characteristic secondary ion mass spectra were applied to the depth analysis of an artificial oxide of an Fe-Al alloy. Through the measurements of the variations with depth of characteristic mass spectrum which is specific to the individual matallic or oxide phase constituting the oxidized alloy, concentration profils of each phase were observed. The measured concentration profiles verified an occurrence at750°C of the following reaction. Fe2O3+2Al→α-Al2O3+2Fe
- 日本質量分析学会の論文
著者
-
KITADA AKIHIKO
Nippon College of Health and Physical Education
-
TAMURA HIFUMI
Central Research Lab., Hitachi Ltd.
-
TAMURA HIFUMI
Central Research Laboratory, Hitachi, Ltd
関連論文
- Detection of SiO_2-Ions from SiO_2-Si Interface by Means of SIMS
- A Plasma Ion Gun with Pierce Electrode
- A New Secondary Ion Extractor with Pierce Electrode
- Electrical Properties of Focused-Ion-Beam Boron-Implanted Silicon
- Boron and Phosphorus Jon Emissions from a Cu-P-Pt-B Liquid Metal Ion Source
- Mass and Energy Analyses of Gallium-Indium Liquid-Metal-Ion Sources
- Development of Phosphorus Liquid-Metal-Ion Source
- Carbon Needle Emitter for Boron and Aluminum Ion Liquid-Metal-Ion Sources
- Ion Microprobe Analyzer with Wien Filter for Primary Ion Mass Separation(速報)
- Surface Analyzer Combining Secondary Ion Mass Spectrometry and Ion Scattering Spectrometry(速報)
- Application of Characteristic Secondary Ion Mass Spectra to a Depth Analysis of Iron Aluminum Oxide
- Surface Analysis of Insulating Materials by Means of an Ion Microprobe Analyzer