蛍光X線分析法による米試料中カドミウムの簡易迅速スクリーニング分析

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A rapid and simple method for determining sub-ppm levels of Cd in rice samples by using an X-ray fluorescence spectrometer (XRF) was developed to improve the efficiency of screening for Cd in rice. A sample tablet with a diameter of 20 mm formed by applying pressure to 3g of rice was used. The use of a 125-μm-thick X-ray tube filter made of Zr increased the detection sensitivity toward Cd. The detection limit was 0.1mg kg^<-1> at a measuring time of 1,800 s. The calibration line for Cd in rice flour showed a good linearity within the range 0.2-2.0mg kg^<-1>. Results for the analysis of reference materials [NIES No.10-b, 10-c] by the XRF technique agreed with their certified values. The values determined by XRF for six samples of rice with Cd concentrations ranging from 0.2 to 1.6mg kg^<-1> agreed with the values determined by ICP-MS. These results indicate that the XRF method has sufficient accuracy for the analysis of sub-ppm levels of Cd. By a regression analysis of standard samples at a measuring time of 1,800s, rice samples that were analyzed as containing less than 0.26mg kg^<-1> of Cd could be classified as belonging to the group with Cd concentrations below 0.4mg kg^<-1>. When the measuring time was shortened to 600s, it was judged that if the analytical results of the samples were below 0.17mg kg^<-1>, their Cd concentrations did not exceed the 0.4mg kg^<-1> threshold. This result suggested that the screening technique is capable of handling six samples an hour. The same analytical results were obtained for ground and nonground samples, indicating that the grinding procedure can be omitted.
社団法人日本土壌肥料学会の論文
2006-04-05

蛍光X線分析法による米試料中カドミウムの簡易迅速スクリーニング分析

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