Preparation of BaM ferrite film for perpendicular recording(Optical recording & PMR media,The 8th Asian Symposium on Information Storage Technology (ASIST-8))
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概要
- 論文の詳細を見る
The BaM ferrite film with fine grain size as small as 30nm were prepared by reactive RF diode sputter, using alternate depositing process. It is found out that two step annealing process is beneficial to form perpendicular orientation structure, which were identify by microstructure measurement such as X-ray diffraction (XRD) and Conversion Electron Mossbauer Spectra (CEMS).
- 社団法人電子情報通信学会の論文
- 2006-11-02
著者
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Wang Xuan
Research Institute Of Magnetic And Materials Lanzhou University
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Wei Fulin
Lanzhou Univ. Gansu Chn
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Wei Fulin
Research Institute Of Magnetic Materials
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Yang Zheng
Lanzhou Univ. Gansu Chn
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Yang Zheng
Research Institute Of Magnetic Materials
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LIU Xi
Research Institute of Magnetic and Materials, Lanzhou University
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ZHENG Kuohai
Research Institute of Magnetic and Materials, Lanzhou University
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KAMZIN A.
Ieffe Physicotechnical Institute, Russion Academy of Science
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Liu Xi
Research Institute Of Magnetic And Materials Lanzhou University
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Kamzin A.
Ieffe Physicotechnical Institute Russion Academy Of Science
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Zheng Kuohai
Research Institute Of Magnetic And Materials Lanzhou University
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Yang Zheng
Research Institute Of Magnetic And Materials Lanzhou University
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