Power and exponential sums of digital sums with information per digits

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Relationship between 〈111〉 Rotation Recrystallization Mechanism and Slip Bands with Compressive Strains during Tensile Deformation in Aluminum Single Crystals
In-situ Measurement of Temperature Variation in Si Wafer During Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation
Rotations Involved in Tensile Deformation and Recrystallization in Fe-11Cr-19Ni Alloy Single Crystal
Axial Compression and Post-Deformation Annealing of Aluminum Single Crystal
Tensile Deformation and Recrystallization in Copper Single Crystal and Bicrystal with Schmid Factor of 0.5
Deformation and Recrystallization of Aluminum Bicrystals Having Asymmetric Tilt Grain Boundary
Slip Morphology and Recrystallization in Copper Single Crystals Tensile-Deformed along and Direction
Deformation and Recrystallization in Lightly-Rolled Aluminum Single Crystals of Cube Orientation
Deformation and Recrystallization of Tensile-deformed or Rolled Fe-3%Si Alloy Single Crystals
Relationship between Deformation and Recrystallization Structures in Fe-Si Single Crystal and Bicrystal Containing {111} Grain
Correspondence between Surface Morphological Faults and Crystallographic Defects in 4H-SiC Homoepitaxial Film
Effect of Cross Slips on Deformation Microstructure and Recrystallization in and Al Single Crystals
Electron Backscatter Diffraction Analysis of Recrystallized Grains Formed in Deformation Band in Aluminum Single Crystal
Relationship between Deformation and Recrystallization in Σ3 Isoaxial Aluminum Bicrystal Deformed in Tension along the Axis
Recrystallization of Tensile-Deformed Fe-11Cr-19Ni Alloy Single Crystal
Influence of Activated Dislocations on Recrystallization near Grain Boundaries in Coarse-Grained Fe-30Cr Alloy
Recrystallization Involving Rotation in Fe-11Cr-19Ni Alloy Single Crystal
Recrystallization Mechanism Involving Rotation in Fe-30Cr Alloy Single Crystal
Relationship between Active Slip Systems and Orientations of Recrystallized Grains in Fe-30Cr Alloy
Defect Formation in (0001)- and (1120)-Oriented 4H-SiC Crystals P^+-Implanted at Room Temperature
Ultrafast Coherent Control of Excitons and Exciton-Polaritons in Quantum Nanostructure
Ultrafast Coherent Control of Excitons in Quantum Nano-Structures
Raman Spectroscopic Stress Evaluation of Femtosecond-Laser-Modified Region Inside 4H-SiC
Log-Normality of Air Contaminants and Its Hidden Characteristics Useful for Industrial Hygiene Technology
Transmission Electron Microscopy of Sublimation-Grown GaN Single Crystal and GaN Homoepitaxial Film
An Explicit Formula of the Newman-Coquet Exponential Sum
An Explicit Formula of the Newman-Coquet Exponential Sum
Power and exponential sums of digital sums with information per digits
Power and exponential sums of digital sums with information per digits
An Explicit Formula of Subblock Occurrences for the p-Adic Expansion
An Explicit Formula of Subblock Occurrences for the p-Adic Expansion
Digital Sum Problems for the p-adic Expansion of Natural Numbers
Digital Sum Problems for the p-adic Expansion of Natural Numbers
Multifractal Spectrum of Multinomial Measures
A Generalization of Hata-Yamaguti's Results on the Takagi Function II: Multinomial Case
An Explicit Formula of the Exponential Sums of Digital Sums
An Explicit Formula of the Exponential Sums of Digital Sums
Simultaneous Bilateral Spontaneous Pneumothorax Observed during the Administration of Gefitinib for Lung Adenocarcinoma with Multiple Lung Metastases
Millisecond Rapid Thermal Annealing of Si Wafer Induced by High-Power-Density Thermal Plasma Jet Irradiation and Its Application to Ultrashallow Junction Formation
Strain Induced Premelting at Grain Boundaries and Deformation Bands in Copper Bulk Bicrystals
Formation of Low-Defect-Concentration Polycrystalline Silicon Films by Thermal Plasma Jet Crystallization Technique
Analysis of Transient Temperature Profile During Thermal Plasma Jet Annealing of Si Films on Quartz Substrate
Crystallization of Si in Millisecond Time Domain Induced by Thermal Plasma Jet Irradiation
In-situ Measurement of Temperature Variation in Si Wafer during Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation
Internal Residual Stress Measurements of Tensile-Deformed Aluminum Single Crystals Using Synchrotron Radiation
Source of surface morphological defects formed on 4H-SiC homoepitaxial films

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