X-Ray Photoelectron Spectroscopy of Ag- and Cu-Doped Amorphous As_2Se_3
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概要
- 論文の詳細を見る
X-ray phototelectron spectroscopy was used to determine the binding energies of the core electrons in Ag- or Cu-doped amorphous As_2Se_3 films. Chemical shifts of the constituent elements indicate the electron transfer from Ag or Cu to As and Se upon doping. Charged defects are induced to As-Se bonds. The mechanism of the migration of Ag and Cu in amorphous As_2Se_3 is discussed.
- 社団法人応用物理学会の論文
- 1981-07-05
著者
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Odajima Akira
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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UENO Tokihiro
Department of Applied Physics, Faculty of Engineering, Hokkaido University
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Ueno Tokihiro
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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Odajima Akira
Department Of Applied Phusics Faculty Of Engineering Hokkaido University
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