Effects of Impurities and Specimen History on Bilayered NiO Scales

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1974-04-05

著者

• Ueno Tokihiro

  Department Of Applied Physics Faculty Of Engineering Hokkaido University

関連論文

• Thermal and Photo Effects on the Textural Change of Red Amorphus Selenium
• X-Ray Photoelectron Spectroscopy of Ag- and Cu-Doped Amorphous As_2Se_3
• X-Ray Photoemission Spectra of Valence and Inner Shells in Amorphous Ge-Se System
• X-Ray Photoelectron Spectroscopy of Ag- and Cu-Doped Amorphous As_2Se_3 and GeSe_2
• Study of Photo-Induced Effect in Obliquely-Deposited Amorphous Ge-Se Films by XPS
• Fine Structures in the Absorption Spectrum of NiO
• The Analysis of the Contour of the Green-Series Exciton Lines in Cu_2O
• Effects of Impurities and Specimen History on Bilayered NiO Scales
• On the Contour of Absorption Lines n=2 of the Yellow and the Green Series in Cu_2O
• On the Contour of the Absorption Lines in Cu_2O
• Growth of Trigonal Se and Te Films on Glass
• Stress Measurements in the High-Temperature Scaling of Nickel
• Crystallization of Amorphous Selenium in the Cylindrical Morphology
• Effects of the Surface Contour on the Bilayered Scaling of Nickel
• Growth of Bilayered NiO Scales on Nickel
• Chemical Shifts of Photoelectron and Auger Lines in Ag- or Cu-Doped Amorphous GeSe_2 and As_2Se_3
• X-Ray Photoelectron and Anger Electron Spectroscopic Studies of Chemical Shifts in Amorphous Ge-Se System

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