Analysis of the Asymmetric 002 X-Ray Line Profiles of γ-Irradiated Polyethylene
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概要
- 論文の詳細を見る
Asymmetric line profiles of 002 X-ray reflection diffracted from polyethylene have been analyzed. It is found that the asymmetry of the line profile is evidence for a specific correlation between the size and the lattice spacing in the crystallites. This means that the asymmetrical profile consists of two symmetrical profiles whose centroid positions and widths differ from each other. Application to γ-irradiated polyethylene reveals that degradation of crystallites occurs from the surface and that smaller crystallites with larger lattice spacing disappear morc quickly when degraded by γ-irradiation.
- 社団法人応用物理学会の論文
- 1980-07-05
著者
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Yoda Osamu
Takasaki Radiation Chemistry Research Establishment Japan Atomic Energy Research Institute
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Yoda Osamu
Takasaki Research Establishment Japan Atomic Energy Research Institute
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ODAJIMA Akira
Department of Applied Physics, Faculty of Engineering, Hokkaido University
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Odajima Akira
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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Odajima Akira
Department Of Applied Phusics Faculty Of Engineering Hokkaido University
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