How to Determine Parameters of Deep Levels by DLTS Single Temperature Scanning
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概要
- 論文の詳細を見る
A simplified method of determining the energy level and the capture cross-section of a deep level from the DLTS spectrum is proposed, together with a detailed analysis of its spectrum shape.Since this method requires only a single temperature scan, the time necessary to determine parameters from the DLTS becomes greatly shortened.
- 社団法人応用物理学会の論文
- 1979-10-05
著者
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IKOMA Toshiaki
Institute of Industrial Science, University of Tokyo
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ADACHI Yoshio
Institute of Industrial Science, University of Tokyo
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GOTO Hiroshige
Institute of Industrial Science, University of Tokyo
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Ikoma Toshiaki
Institute Of Industrial Science The University Of Tokyo
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Adachi Yoshio
Institute Of Industrial Science University Of Tokyo
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Goto Hiroshige
Institute Of Industrial Science University Of Tokyo
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Adachi Yoshio
Institute for Protein Research, Osaka University
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