Interface States of MOS Diodes with Thin SiO_2 Films

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1973-02-05

著者

• Katsube Teruaki

  Institute Of Industrial Science University Of Tokyo

• Adachi Yoshio

  Institute Of Industrial Science University Of Tokyo

関連論文

• Computer Aided Detection of Slow Motion of Defects in GaP Light Emitting Diodes
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• Thermally Stimulated Capacitance and Thermally Stimulated Current in a p-n Junction with Generation-Recombination Centers
• Small Signal Equivalent Circuit for an MIS Tunnel Diode
• Trap Centers in MNOS Memory Devices Measured by Thermally Stimulated Currents
• Interface States of MOS Diodes with Thin SiO_2 Films
• Effects of a Ramped AC Voltage on the Characteristics of WO_3 Electrochromic Cells

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