Trap Centers in MNOS Memory Devices Measured by Thermally Stimulated Currents
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1973-10-05
著者
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IKOMA Toshiaki
Institute of Industrial Science, University of Tokyo
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Katsube Teruaki
Institute Of Industrial Science University Of Tokyo
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ADACHI Yoshio
Institute of Industrial Science, University of Tokyo
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Ikoma Toshiaki
Institute Of Industrial Science The University Of Tokyo
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Adachi Yoshio
Institute Of Industrial Science University Of Tokyo
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Adachi Yoshio
Institute for Protein Research, Osaka University
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