Determination of the Linear Electrooptic Coefficient of a Lead Zirconate Titanate Thin Film Using Two-Beam Polarization Interferometer with an Adaptive Photodetector
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概要
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A novel interferometric modulation technique for optical thin-film testing using a two-beam polarization (TBP) inteuferometer with GaAs:Cr adaptive photodetector is presented. The technique enables determination of Pockels coefficient of thin films with a strong Fabry-Perot effect and automatic adjustment and maintenance operation point of the intetferometer. We use this method for measuring the effective differential linear electrooptic coefficient r_c = r_<33> - (n_0/_c)^3_<13> of lead zirconate titanate (PZT) thin film. A strong hysteresis effect with a slightly asymmetric form of the hysteresis loop was observed for the dependence of the effective differential Pockels coefficient of the PZT thin film on the DC electric field. The values of r_e are in agreement with known data.
- 社団法人応用物理学会の論文
- 1998-05-01
著者
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NO Kwangsoo
Department of Materials Science and Engineeing, KAIST
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No Kwangsoo
Department Of Material Science And Engineering Korea Advanced Institute Of Science And Technology
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Sokolov Igor
A.f. Loffe Physico-technical Institute
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Spirin Vasilii
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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LEE Changho
Department of Materials Science and Engineering
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Lee C
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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