Migration of Metals on Graphite in Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
Metals such as Au deposited on graphite substrates are found to migrate very easily when biased in scanning tunneling microscopes. Depending upon the film thickness and the tip voltage, a hillock surrounded by grooves or a hole surrounded by hillocks with a height of 〜±10 nm and a lateral dimension of 〜100 nm are formed. The mechanism of these surface-modification phenomena is discussed in light of electro- and thermomigration.
- 社団法人応用物理学会の論文
- 1995-06-01
著者
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TANAKA Keiji
Department of Applied Chemistry, Kyushu University
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Yamaguchi Satoru
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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OHTO Masanori
Department of Applied Physics, Faculty of Engineering, Hokkaido University
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Ohto Masanori
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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Tanaka Keiji
Department Of Applied Chemistry Kyushu University
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