Ge Atomic Layer Epitaxy by Use of Ar Ion Laser Heating : Beam Induced Physics and Chemistry
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1989-12-30
著者
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TAKAHASHI Yasuo
NTT LSI Laboratories
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Urisu Tsuneo
Ntt Lsi Laboratories 3-1
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Urisu Tsuneo
Ntt Lsi Laboratories
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Takahashi Yasuo
Ntt Lsi Laboratories 3-1
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SESE Yoshiteru
Nagaoka University of Technokogy 1603-1
関連論文
- Si Single-Electron Transistors on SIMOX Substrates (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
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- Energy Eigenvalues and Quantized Conductance Values of Electrons in Si Quantum Wires on {100} Plane
- Fabrication and Electrical Characteristics of Silicon Quantum Dot Devices
- Novel Fabrication Technique for a Si Single-Electron Transistor and Its High Temperature Operation
- Thermal Agglomeration of Thin Single Crystal Si on SiO_2 in Vacuum
- Photoluminescence from a Silicon Quantum Well Formed on Separation by Implanted Oxygen Substrate
- Quantized Conductance of a Silicon Wire Fabricated by Separation-by-Implanted-Oxygen Technology
- Self-Limiting Adsorption of SiCl_2H_2 and Its Application to the Layer-by-Layer Photochemical Process
- Measurements of Diffusion Coefficients of Water in Electron Cyclotron Resonance Plasma SiO_2
- Ge Atomic Layer Epitaxy by Use of Ar Ion Laser Heating : Beam Induced Physics and Chemistry
- Ge Atomic Layer Epitaxy by Use of Ar Ion Laser Heating