Etching Characteristics of n^+ Poly-Si and Al Employing a Magnetron Plasma
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-04-20
著者
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HORIIKE Yasuhiro
Toshiba Research and Development Center
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Okano Haruo
Toshiba Research and Development Center
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Yamazaki Takashi
Toshiba Research and Development Center
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Tokura Tsunemasa
Tokuda Seisakusho
関連論文
- Growth of Large Grained Silicon on Insulator by Electron Beam Annealing and Performance of MOS Devices : A-6: SILICON CRYSTALS
- Etching Characteristics of n^+ Poly-Si and Al Employing a Magnetron Plasma
- High-Rate Reactive Ion Etching of SiO_2 Using a Magnetron Discharge
- Reactive Ion Beam Etching of SiO_2 and Poly-Si Employing C_2F_6, SiF_4 and BF_3 Gases
- Si Etch Rate and Etch Yield with Ar^+/Cl_2 System
- Single Silicon Etching Profile Simulation
- Photo-Excited Etching of Poly-Crystalline and Single-Crystalline Silicon in Cl_2 Atmosphere
- Si and SiO_2 Etching under Low Self-Bias Voltage
- Aluminum Reactive Ion Etching Employing CCl_4+Cl_2 Mixture
- Si and SiO_2 Etching Characteristics by Fluorocarbon Ion Beam