Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect Scattering in Low Dimensional Systems
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1990-11-20
著者
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Ahmed H
Univ. Cambridge Cambridge Gbr
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POTTS A.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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WILLIAMS D.
Hitachi Cambridge Laboratory, Hitachi Europe Limited
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YOUNG R.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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BLAIKIE R.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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MCMAHON R.
Cambridge University Engineering Department
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HASKO D.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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CLEAVER J.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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AHMED H.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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Mcmahon R
Cambridge University Engineering Department
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Cleaver J
Cavendish Lab. Cambridge Gbr
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Potts A.
Microelectronics Research Center Cavendish Laboratory University Of Cambrige
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Potts A.
Microelectronics Research Centre Cavendish Laboratory University Of Cambridge
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Hasko D
Univ. Cambridge Cambridge Gbr
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Hasko D.
Microelectronics Research Centre Cavendish Laboratory
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Blaikie R.
Microelectronics Research Centre Cavendish Laboratory University Of Cambridge
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Williams D
Univ. Cambridge Cambridge Gbr
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Ahmed H
Cavendish Lab.
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Young R.
Microelectronics Research Centre Cavendish Laboratory University Of Cambridge
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Williams D.
Hitachi Cambridge Laboratory Cavendish Laboratory
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Ahmed H.
Microelectronics Research Center Cavendish Laboratory University Of Cambridge
関連論文
- Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect Scattering in Low Dimensional Systems
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- Application of Focused Ion Beam Implantation to Produce Gallium Arsenide Metal Semiconductor Field-Effect Transistors with a Novel Doping Profile
- Optimisation of Tunnel Barriers for nc-Si Single-Electron Transistors
- Structural and Electrical Characterization of Nanocrystalline Silicon (nc-Si) Single Electron Transistors
- Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect scattering in Low Dimensional Systems : Microfabrication and Physics
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