Structural and Electrical Characterization of Nanocrystalline Silicon (nc-Si) Single Electron Transistors
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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AHMED H.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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Durrani Z.
Microelectronics Research Centre University Of Cambridge
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TAN Y.
Microelectronics Research Center, Cavendish Laboratory, University of Cambridge
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KAMIYA T.
Microelectronics Research Center, Cavendish Laboratory, University of Cambridge
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SHIMIZU I.
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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Tan Y.
Microelectronics Research Centre University Of Cambridge
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Ahmed H.
Microelectronics Research Center Cavendish Laboratory University Of Cambridge
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KAMIYA T.
Microelectronics Research Centre, University of Cambridge
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- Structural and Electrical Characterization of Nanocrystalline Silicon (nc-Si) Single Electron Transistors
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