Optimisation of Tunnel Barriers for nc-Si Single-Electron Transistors
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概要
- 論文の詳細を見る
- 2001-09-25
著者
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AHMED H.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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Durrani Z.
Microelectronics Research Centre University Of Cambridge
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TAN Y.
Microelectronics Research Center, Cavendish Laboratory, University of Cambridge
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KAMIYA T.
Microelectronics Research Center, Cavendish Laboratory, University of Cambridge
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Tan Y.
Microelectronics Research Centre University Of Cambridge
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Ahmed H.
Microelectronics Research Center Cavendish Laboratory University Of Cambridge
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KAMIYA T.
Microelectronics Research Centre, University of Cambridge
関連論文
- Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect Scattering in Low Dimensional Systems
- UHV-STM Study of Electron Emission from Individual Silicon Nanopillars
- Optimisation of Tunnel Barriers for nc-Si Single-Electron Transistors
- Characterization of Tunnel-Barriers in Polycrystalline Si Point-Contact Single-Electron Transistors
- Structural and Electrical Characterization of Nanocrystalline Silicon (nc-Si) Single Electron Transistors
- Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect scattering in Low Dimensional Systems : Microfabrication and Physics
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