Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect scattering in Low Dimensional Systems : Microfabrication and Physics
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-01-31
著者
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AHMED H.
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge
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Cleaver J.r.a.
Microelectronics Research Center Cavendish Laboratory Cambridge University
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Cleaver J.r.a.
Microelectronics Research Center Cavendish Laboratory University Of Cambrige
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Potts A.
Microelectronics Research Center Cavendish Laboratory University Of Cambrige
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Hasko D.g.
Microelectronics Research Center Cavendish Laboratory University Of Cambrige
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Blaikie R.j.
Microelectronics Research Center Cavendish Laboratory University Of Cambrige
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WILLIAMS D.A.
Hitachi Cambridge Laboratory, Hitachi Eutope Limited
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YOUNG R.J.
Microelectronics Research Center, Cavendish Laboratory, University of Cambrige
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MCMAHON R.A.
Cambridge University Engineering Department
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Young R.j.
Microelectronics Research Center Cavendish Laboratory University Of Cambrige
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Williams D.a.
Hitachi Cambridge Laboratory Hitachi Europe Ltd.
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Williams D.a.
Hitachi Cambridge Laboratory Hitachi Eutope Limited
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Ahmed H.
Microelectronics Research Center Cavendish Laboratory University Of Cambridge
関連論文
- Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect Scattering in Low Dimensional Systems
- UHV-STM Study of Electron Emission from Individual Silicon Nanopillars
- Optimisation of Tunnel Barriers for nc-Si Single-Electron Transistors
- Structural and Electrical Characterization of Nanocrystalline Silicon (nc-Si) Single Electron Transistors
- Fabrication of Free-Standing Single-Crystal Silicon Nanostructures for the Study of Thermal Transport and Defect scattering in Low Dimensional Systems : Microfabrication and Physics
- Nanoscale Field Emission Triode
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