Infrared Reflection Absorption in Vacuum-Deposited Polyethylene Film with Rough Surface

概要

論文の詳細を見る
The thickness dependence of infrared reflection absorption (IR-RAS) is studied for vacuum-evaporated polyethylene(PE) film for an area 2 cm in diameter. The p-component of the intensity in IR RAS, I_<AP>, ls proportional to the thickness, d, as predicted theoretically when p-polarized infrared rays are incident at an angle of 70°. The s-component, I_<AS>, is also detected when s-polarized rays are incident although it is given numerically that I_<AS> is too small to detect. In particular, the amount of I_<AS> increases dramatically for the film with the rougher surface. For such film, the s-component also becomes large when p-polarized rays are incident. This means that the film is not optically homogeneous or isotropic. The usefulness of determining the thickness dependence of I_<AP> for thin film growth of polymeric materials is also discussed.
社団法人応用物理学会の論文
1990-09-20