X線回折線の積分幅に関する統計学的解析

概要

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An equation for calculating the standard deviation (s. d.) σ_<IB> of the integral breadth I_B of an X-ray diffraction line is derived analytically. The s. d. (σ_<IB> represents the size of the variation in I_B which ; attributable to counting statistics. The trapezoidal and Simpson's rules give the same results for both I_B andσ_<IB> the trapezoidal rule is recommended because it makes for easier calculation. The s. d. σ_<IB> is given by σ_<IB>=R/((R-1)√<y_p>)√<1/(2R)(nc-I_B)^2+I_B^2> (1) where R is the ratio of peak to background of the diffraction line, y_p is the maximum count, n is the number of data points minus 1, and c is a step width. The s. d. σ_<IB> agreed closely with the sample standard deviation obtained in 70 repetitive measurements of I_B. This shows that the s. d. of I_B can e obtained from a single measurement by using Eq. (1).
一般社団法人日本機械学会の論文
1989-08-25