ガウス曲線法による窒化けい素のX線残留応力測定

概要

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Residual stress induced by sintering or machining has a large effect on the strength of ceramics. The X-ray technique can measure residual stress nondestructively. To determine accurately the stress by X-ray method, it is necessary to obtain experimentally the X-ray stress constant. By using the Gaussian curve methodν, the X-ray elastic constants E and ν, and stress constant K of a silicon nitride were determined together with their standard deviations representing the size of the variability caused by counting statistics. The planes of (323) and (212) were measured with CuKα and CrK α radiations, respectively. The 95% confidence limits of the stress constant were -779 ± 21 and -1027 ± 83 (MPa/deg) for (323) and (212) planes, respectively. The relative errors (standard deviation /measured value) of the X-ray elastic constants and stress constant for the (323) plane having a sharp and symmetrical Kα_1 single diffraction profile were 1.4 %, whereas they were 3.4 to 4.3 % for the (212) plane having a Kα doublet.
一般社団法人日本機械学会の論文
1989-01-25