定時計数法による回折線半価幅の統計学的解析

概要

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The half-width of diffraction line profile is widely used to evaluate the broadness of a diffraction line. To evaluate the reproducibility in measurements of the half-width B, the standard deviation of half-width, σ_B, arising from counting statistics is derived analytically. It can be calculated from a single measurement. An approximate value of σ_B is given by σ_B=√(2y_m+3y_4))/(√3M) where y_4 is the maximum count, and y_m and M are the X_ray counts and the slope of the side of the diffraction line at half its height, respectively. This equation shows that σ_B depends only on X_ray counts and the slope at half height of the diffraction line, being independent of the half-width. Additionally, σ_B is inversely proportional to the square roots of X_ray counts and preset time.
一般社団法人日本機械学会の論文
1988-12-25