集合組織をもつ材料のX線応力測定法

概要

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The change in peak positions of a diffraction line with sin^2 ψ for various applied stresses σ_o was measured for determining residual stress of textured materials by X-ray diffraction. Three specimens were prepared from a sintered silicon carbide α-SiC and a cold-rolled stainless steel type SUS304. For each applied stress σ_o, seven peak positions for different ψ angles were measured. They were oscilated on the sin^2 ψ diagram. However, the slope M and the intercept N of the straight line that was fitted to the seven peak positions varied linearly with the applied stress σ_o. It is confirmed analytically and experimentally that this experimental evidence shows that the lattice strain for a fixed ψ angle varies linearly with applied stress as is the case with isotropic materials. Therefore, the stress constant K of textured materials can be determined experimentally as the reciprocal of the slope of the straight line of the M-σ_o diagram.
社団法人日本機械学会の論文
1996-04-25