Microwave Harmonic Generation in Semicondctors at Low Temperatures. : II. Silicon
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概要
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A resonance type third harmonic generation (THG) in a magnetic field is observed in n-type silicon under illumination at liquid helium temperatures as in the case of n-type germanium (T. Kamiya et al.:J. Phys. Soc. Japan 27 (1969) 679 ). A photo-response of the THG is investigated in detail, and the THG shows complicated decay below 2°K after the illumination. This shows that the resonance of electrons in very shallow trapping states. A phenomenological analysis of the complicated dacay is made based on a model, in which there are two series of energy levels in the trapping center, and the thermal ionization energies are obtained to be 0.63±0.13 meV and 0.42±0.07 meV for each ground state. This result seems to indicate that the obsorved trapping center is attributed to the donor negative ion(D-). Another experiment on thermally stimulated current (TSC) in n-type silicon is carried out below 1°K, and the depth of the trapping state obtained is almost the same as that observed in the THG experiment.
- 社団法人日本物理学会の論文
- 1969-11-05
著者
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Kamiya Takeshi
Department Of Gastroenterology And Metabolism Nagoya City University Graduate School Of Medical Scie
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TANAKA SHOJI
Department of Impairment Study, Graduate Course of Rehabilitation Science, Division of Health Scienc
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Tanaka Shoji
Department Of Applied Physics Waseda University
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Kamiya Takeshi
Department Of Applied Physics Faculty Of Engineering University Of Tokyo:(present Address) Departmen
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YOSHIZAKI Ryozo
Department of Applied Physics, University of Tokyo
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Yoshizaki Ryozo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Yoshizaki Ryozo
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo:department Of Applied P
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Tanaka Shoji
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Tanaka Shoji
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Tanaka Shoji
Department Of Applied Physics Faculty Fo Engineering University Of Tokyo
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