High-Resolution Transmission Electron Microscopy Observation of Liquid-Phase Bonded Aluminum/Sapphire Interfaces
スポンサーリンク
概要
- 論文の詳細を見る
- 2009-05-01
著者
-
Choi Si-young
Institute Of Engineering Innovation The University Of Tokyo
-
IKUHARA Yuichi
Institute of Engineering Innovation, University of Tokyo
-
Shibata Naoya
Institute Of Engineering Innovation School Of Engineering The University Of Tokyo
-
Shibata Naoya
Institute Of Engineering Innovation The University Of Tokyo
-
KUROMITSU Yoshirou
Central Research Institute, Mitsubishi Materials Corporation
-
Ikuhara Yuichi
Institute Of Engineering Innovation School Of Engineering The University Of Tokyo
-
Akiyama Kazuhiro
Central Research Institute Mitsubishi Materials Corporation
-
MONTESA Christine
Department of Materials Science and Engineering, The University of Tokyo
-
TONOMURA Hiroshi
Central Research Institute, Mitsubishi Materials Corporation
-
Kuromitsu Yoshirou
Central Research Institute Mitsubishi Materials Corporation
-
Tonomura Hiroshi
Central Research Institute Mitsubishi Materials Corporation
-
Montesa Christine
Department Of Materials Science And Engineering The University Of Tokyo
-
IKUHARA Yuichi
Institute of Engineering Innovation, The University of Tokyo
-
IKUHARA Yuichi
Institute of Engeering Innovation, School of Engineering, The University of Tokyo
関連論文
- Non-linear Current-Voltage Property across Σ5(210) Symmetric Tilt Boundary in Nb-Doped SrTiO_3 Bicrystal
- Oxygen Pipe Diffusion in Sapphire Basal Dislocation(Characterization,Guest Editors Dedicated to Prof. Gunter Petzow: Modern Trends in Advanced Ceramics)
- Optical and Structural Characterization of InGaN/GaN Multiple Quantum Wells by Epitaxial Lateral Overgrowth
- Atomic and Electronic Structures of Ni/YSZ(111) Interface
- High Temperature Deformation Behavior of [0001] Symmetrical Tilt Σ7 and Σ21 Grain Boundaries in Alumina Bicrystals
- First-Principles Characterization of Atomic Structure of Al_2O_3(0001)/Cu Nano-Hetero Interface
- Structure of [110] tilt grain boundaries in zirconia bicrystals
- Thermoelectric Properties of the Layered Cobaltite Ca_3Co_4O_9 Epitaxial Films Fabricated by Topotactic Ion-Exchange Method
- Atomic Structure and Relaxation Behavior at AlN(0001)/Al_2O_3(0001) Interface(Characterization,Guest Editors Dedicated to Prof. Gunter Petzow: Modern Trends in Advanced Ceramics)
- First Principles Calculations of Vacancy Formation Energies in *13 Pyramidal Twin Grain Boundary of α-Al_2O_3
- Structure and Configuration of Boundary Dislocations on Low Angle Tilt Grain Boundaries in Alumina
- First Principles Study on Intrinsic Vacancies in Cubic and Orthorhombic CaTiO_3
- Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
- Changes in Microstructure of Al/AlN Interface during Thermal Cycling
- 15-O-08 HRTEM Characterization of Atomic Structures in Cu/α-Al_2O_3 Interfaces
- High-Resolution Transmission Electron Microscopy Observation of Liquid-Phase Bonded Aluminum/Sapphire Interfaces
- Effect of SC1 Process on Silicon Surface Microroughness and Oxide Breakdown Characteristics
- Grain Boundary Energy and Tensile Ductility in Superplastic Cation-doped TZP
- High Resolution Microscopy Study for [001] Symmetric Tilt Boundary with a Tilt Angle of 66゜in Rutile-type TiO_2 Bicrystal
- Dislocation-Free InGaAs on Si(111) Using Micro-Channel Selective-Area Metalorganic Vapor Phase Epitaxy
- Microstructure Evolutions at Severely-deformed Austenite/Martensite Interfaces of a Layer-integrated Steel
- Formation of a Cr3+-rich luminescent thin phase along a grain boundary of α-Al2O3
- Mechanical properties of 2.0-3.5mol% Y_2O_3-stabilized zirconia polycrystals fabricated by the solid phase mixing and sintering method
- Mechanical properties of Y_2O_3-stabilized ZrO_2 polycrystals fabricated by the solid phase mixing and sintering method
- Direct Imaging of Hydrogen within a Crystalline Environment
- Effects of Dislocations on the Oxygen Ionic Conduction in Yttria Stabilized Zirconia
- Identification of crack path of inter- and transgranular fractures in sintered silicon nitride by in situ TEM
- Oxide Ceramics with High Density Dislocations and Their Properties
- Heterointerfaces: atomic structures, electronic states, and related properties
- Zr segregation and associated Al vacancies in alumina grain boundaries
- TEM analysis of dislocation structures formed in the Cr-doped grain boundary of alumina
- Diffusion Model of Gallium in Single-Crystal ZnO Proposed from Analysis of Concentration-Dependent Profiles Based on the Fermi-Level Effect
- Detecting Real Oxygen Ions in Polycrystalline Diamond Thin Film using Secondary Ion Mass Spectrometry
- Scanning Transmission Electron Microscopy and Thermoelectric Properties of Sr-Doped Misfit Cobalt Oxide
- Microstructure and Crystal Phase Development of Y2O3-Stabilized ZrO2 Polycrystal Fabricated by the Solid Phase Mixing and Sintering Method
- Effects of TiO_2 Support on the Initial Stage of Pt Nanoparticle Growth