Effect of Thermal Data-Imprint on 2T/2C FeRAM Cell Operation
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概要
- 論文の詳細を見る
- 1999-09-20
著者
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林 喜宏
日本電気(株)マイクロエレクトロ二クス研究所
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HAYASHI Yoshihiro
ULSI Research Laboratory, Microelectronics Research Laboratories, NEC Corporation
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Inoue Naoya
Ulsi Res. Lab Silicon Systems Res. Labs. Nec
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Hayashi Yoshihiro
Microelectronics Research Laboratories Nec Corporation
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Hayashi Yoshihiro
Device Platforms Research Labs. Nec Corporation
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Hayashi Yoshihiro
Ulsi Res. Lab Silicon Systems Res. Labs. Nec
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