Temperature-Dependent Contrasts of Lateral p^+-n Junctions on H/Si(100) Imaged with Photoemission Electron Microscopy
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2005-12-10
著者
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Ueda Kazuyuki
Toyota Technological Inst. Nagoya Jpn
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Ueda Kazuyuki
Nano High Tech Res. Center Toyota Technological Inst.
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YOSHIMURA Masamichi
Nano High-Tech Research Center, Toyota Technological Institute
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FUKIDOME Hirokazu
Nano High-Tech Research Center, Toyota Technological Institute
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Yoshimura Masamichi
Nano High-tech Research Center Toyota Technological Institute
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Yoshimura Masamichi
Nano High-tech Research Center Toyota Technological Insitute
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Fukidome Hirokazu
Nano High-tech Research Center Toyota Technological Institute
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