Observation of Si(110) Surfaces by High-Temperature Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-07-30
著者
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Ueda K
Toyota Technological Institute
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Ueda Kazuyuki
Toyota Technological Inst. Nagoya Jpn
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UEDA Ken-ichi
Institute for Laser Science, University of Electro-Communications
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Ueda K
Institute For Laser Science University Of Electro-communications
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Ueda K
Kyushu Univ. Fukuoka Jpn
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Ueda Kazuyuki
Toyota Technological Institute
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Ueda Kentaro
Department Of Electronic Science And Engineering Kyoto University
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AN Toshu
Toyota Technological Institute
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YOSHIMURA Masamichi
Toyota Technological Institute
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Ueda Kenichi
Institute For Laser Science University Of Electro-communications
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Ueda Kunihiro
Advanced Materials Research Department R & D Center Tdk Corporation
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Yoshimura M
Toyota Technological Institute
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YOSHIMURA Masamichi
Toyota Tech. Inst.
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