Evaporation and Thermionic Emission Processes of Pb/W(110) Imaged In Situ by Emission Electron Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
Evaporation and thermionic emission processes of Pb/W(110) have been studied in situ by emission electron microscopy (EEM). By the photoemitted EEM, the evaporation of Pb except the first layer has been observed in situ at 603–673 K, resulting in an increase in the work function that prevents photoemission of electrons. By heating to 1200 K, the surface can be again imaged by EEM even without illumination, i.e., thermionic emission electron microscopy (TEEM). This TEEM observation at lower temperatures than usual becomes possible owing to thermionic emission assisted by the electric field between the objective lens and the surface.
- 2006-01-15
著者
-
Ueda Kazuyuki
Nano High Tech Res. Center Toyota Technological Inst.
-
Yoshimura Masamichi
Nano High-tech Research Center Toyota Technological Insitute
-
Fukidome Hirokazu
Nano High-tech Research Center Toyota Technological Institute
-
Fukidome Hirokazu
Nano High-Tech Research Center, Toyota Technological Institute, 2-12-1 Hisakata, Tempaku-ku, Nagoya 468-8511, Japan
関連論文
- Development of Four-Probe Microscopy for Electric Conductivity Measurement
- Simultaneous Measurement of Topography and Contact Current by Contact Mode Atomic Force Microscopy with Carbon Nanotube Probe
- Temperature-Dependent Contrasts of Lateral p^+-n Junctions on H/Si(100) Imaged with Photoemission Electron Microscopy
- A Study of Adsorption of CO on Hydrogen Covered Pt(111) Surface Using Electron-Stimulated Desorption Spectroscopy
- Growth of Carbon Nanowalls on a SiO_2 Substrate by Microwave Plasma-Enhanced Chemical Vapor Deposition
- Microwave Plasma-Enhanced Chemical Vapor Deposition of Carbon Nanostructures Using Biological Molecules
- Visualization of Hydrogen on Ti-6Al-4V Using Hydrogen Microscope
- Palladium Thin-Films on Clean and Hydrogen-Terminated Si(110): The Effect of Hydrogen Termination on Metal Adsorption
- Fabrication of Carbon Nanostructure onto the Apex of Scanning Tunneling Microscopy Probe by Chemical Vapor Deposition
- Regrowth of Carbon Nanotube Array by Microwave Plasma-Enhanced Thermal Chemical Vapor Deposition
- Synthesis of Carbon Nanocoils by Two-step Growth Method Using Microwave Plasma-Enhanced Chemical Vapor Deposition
- Evaporation and Thermionic Emission Processes of Pb/W(110) Imaged In Situ by Emission Electron Microscopy
- Initial Stages of Platinum Silicide Formation on Si(110) Studied by Scanning Tunneling Microscopy
- One-Dimensional Growth of Iron Silicides on Si(553) Surface
- Microscopic Changes of Thin Films of Directly Thiolated Fullerenes Depending on Substrate and Number of Thiol
- Iron Nanowire Formation in Si(110)
- Microwave Plasma-Enhanced Chemical Vapor Deposition of Carbon Nanostructures Using Biological Molecules
- Atomic Structure of Si(553) Surface Revealed by Scanning Tunneling Microscopy
- Development of Four-Probe Microscopy for Electric Conductivity Measurement
- Growth of Carbon Nanowalls on a SiO2 Substrate by Microwave Plasma-Enhanced Chemical Vapor Deposition
- Temperature-Dependent Contrasts of Lateral $ p^{+}$–$n$ Junctions on H/Si(100) Imaged with Photoemission Electron Microscopy