Ueda Kazuyuki | Nano High Tech Res. Center Toyota Technological Inst.

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概要

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著作論文

Development of Four-Probe Microscopy for Electric Conductivity Measurement
Simultaneous Measurement of Topography and Contact Current by Contact Mode Atomic Force Microscopy with Carbon Nanotube Probe
Temperature-Dependent Contrasts of Lateral p^+-n Junctions on H/Si(100) Imaged with Photoemission Electron Microscopy
A Study of Adsorption of CO on Hydrogen Covered Pt(111) Surface Using Electron-Stimulated Desorption Spectroscopy
Growth of Carbon Nanowalls on a SiO_2 Substrate by Microwave Plasma-Enhanced Chemical Vapor Deposition
Microwave Plasma-Enhanced Chemical Vapor Deposition of Carbon Nanostructures Using Biological Molecules
Visualization of Hydrogen on Ti-6Al-4V Using Hydrogen Microscope
Palladium Thin-Films on Clean and Hydrogen-Terminated Si(110): The Effect of Hydrogen Termination on Metal Adsorption
Fabrication of Carbon Nanostructure onto the Apex of Scanning Tunneling Microscopy Probe by Chemical Vapor Deposition
Regrowth of Carbon Nanotube Array by Microwave Plasma-Enhanced Thermal Chemical Vapor Deposition
Synthesis of Carbon Nanocoils by Two-step Growth Method Using Microwave Plasma-Enhanced Chemical Vapor Deposition
Evaporation and Thermionic Emission Processes of Pb/W(110) Imaged In Situ by Emission Electron Microscopy
Initial Stages of Platinum Silicide Formation on Si(110) Studied by Scanning Tunneling Microscopy
One-Dimensional Growth of Iron Silicides on Si(553) Surface
Microscopic Changes of Thin Films of Directly Thiolated Fullerenes Depending on Substrate and Number of Thiol
Iron Nanowire Formation in Si(110)
Microwave Plasma-Enhanced Chemical Vapor Deposition of Carbon Nanostructures Using Biological Molecules
Atomic Structure of Si(553) Surface Revealed by Scanning Tunneling Microscopy
Development of Four-Probe Microscopy for Electric Conductivity Measurement
Growth of Carbon Nanowalls on a SiO2 Substrate by Microwave Plasma-Enhanced Chemical Vapor Deposition
Temperature-Dependent Contrasts of Lateral $ p^{+}$–$n$ Junctions on H/Si(100) Imaged with Photoemission Electron Microscopy

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