Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-11-30

著者

• IWATSUKI Masashi

  JEOL Ltd.

• Kitamura Shin'ichi

  Jeol Ltd.

• Fukuda Yasuo

  Graduate School Of Electronic Science And Technology Shizuoka University

• YONEI Kazunori

  JEOL Ltd.

• MOONEY C.

  Analytical Instrumentation Facility, NC State University

• Iwatsuki Masashi

  Jeol Ltd

• Kitamura Shin’ichi

  JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan

• Mooney C.

  Analytical Instrumentation Facility Nc State University

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