Kitamura Shin'ichi | Jeol Ltd.
スポンサーリンク
概要
関連著者
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Kitamura Shin'ichi
Jeol Ltd.
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Iwatsuki Masashi
Jeol Ltd
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IWATSUKI Masashi
JEOL Ltd.
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Fukuda Yasuo
Graduate School Of Electronic Science And Technology Shizuoka University
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YONEI Kazunori
JEOL Ltd.
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MOONEY C.
Analytical Instrumentation Facility, NC State University
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Kitamura Shin’ichi
JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan
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Mooney C.
Analytical Instrumentation Facility Nc State University
著作論文
- Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves
- Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy