Observation of Ion-Trapping in Single Bunch Operation at the Photon Factory Storage Ring : Nuclear Science, Plasmas and Electric Discharges

スポンサーリンク

概要

著者

関連論文

Scanning Tunneling Microscopy Observation of the Formation of the Smallest Dimer-Adatom-Stacking-fault Domain on a Quenched Si(111) Surface
Detection of the flip-flop motion of buckled dimers on a Ge(001) surface by STM
Little Influence of Kinks on the Formation of c(4×2)Domains in a Si(001)Surface at Low Temperature
Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy
Scanning Tunneling Microscopy Observation of Ar-Ion-Bombarded Si(001) Surfaces and Regrowth Processes by Thermal Annealing
Adsorption of Bismuth on Si(110) Surfaces Studied by Scanning Tunneling Microscopy
Dynamic Observation of Ag Desorptiom Process onm Si(111) Surface by High-Termperature Scanning Tunneling Mieroscopy
High-Temperature Scanning Tunneling Microscopy Observation of a (15, 17, 1) Facet Structure on a Si(110) Surface
High-Temperature Scanning Tunneling Microscopy Study of the Phase Transition of 16-Structure Appearing on a Si(110) Surface
Real-Time Observation of (1×1)-(7×7) Phase Transition on Vicinal Si(111) Surfaces by Scanning Tunneling Microscopy
Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
Scanning Capacitace Microscope/Atomic Force Microscope/Scanning Tunneling Microscope Study of Ion-Implanted Silicon Surfaces
Adsorption and Desorption of AlCl_3 on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Microscopy
Observation of Ion-Trapping in Single Bunch Operation at the Photon Factory Storage Ring : Nuclear Science, Plasmas and Electric Discharges
Higher-Order-Mode Damping Coupler for Beam Instability Suppression
Low-Energy Electron Diffraction and Scanning Tunneling Microscopy Study on the Reconstruction of the Vanadium (111) Surface
Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves
Low-Temperature Electron Microscopy of a Bi_2(Sr, Ca)_3Cu_2O_x Superconductor
Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope
Photon Stimulated Desorption of CO from Si Single Crystal
A Si Single-Crystal Shield-Pipe for Precise Measurement of Synchrotron Radiation Induced Gas Desorption
Scanning Tunneling Microscopy of Clean Silicon Surfaces at Elevated Temperatures

もっと見る

スポンサーリンク