Low-Energy Electron Diffraction and Scanning Tunneling Microscopy Study on the Reconstruction of the Vanadium (111) Surface
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-02-15
著者
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SATO Tomoshige
JEOL Ltd.
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IWATSUKI Masashi
JEOL Ltd.
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Nakayama Koji
Applied Physics Faculty Of Engineering Yokohama National University
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Usami Seiji
Applied Physics Faculty Of Engineering Yokohama National University
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Sato Tomoshige
Jeol
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Iwatsuki Masashi
Jeol
関連論文
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- Little Influence of Kinks on the Formation of c(4×2)Domains in a Si(001)Surface at Low Temperature
- Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy
- Scanning Tunneling Microscopy Observation of Ar-Ion-Bombarded Si(001) Surfaces and Regrowth Processes by Thermal Annealing
- Adsorption of Bismuth on Si(110) Surfaces Studied by Scanning Tunneling Microscopy
- Dynamic Observation of Ag Desorptiom Process onm Si(111) Surface by High-Termperature Scanning Tunneling Mieroscopy
- High-Temperature Scanning Tunneling Microscopy Observation of a (15, 17, 1) Facet Structure on a Si(110) Surface
- High-Temperature Scanning Tunneling Microscopy Study of the Phase Transition of 16-Structure Appearing on a Si(110) Surface
- Real-Time Observation of (1×1)-(7×7) Phase Transition on Vicinal Si(111) Surfaces by Scanning Tunneling Microscopy
- Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- Scanning Capacitace Microscope/Atomic Force Microscope/Scanning Tunneling Microscope Study of Ion-Implanted Silicon Surfaces
- Adsorption and Desorption of AlCl_3 on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Microscopy
- Observation of Ion-Trapping in Single Bunch Operation at the Photon Factory Storage Ring : Nuclear Science, Plasmas and Electric Discharges
- Higher-Order-Mode Damping Coupler for Beam Instability Suppression
- Low-Energy Electron Diffraction and Scanning Tunneling Microscopy Study on the Reconstruction of the Vanadium (111) Surface
- Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves
- Low-Temperature Electron Microscopy of a Bi_2(Sr, Ca)_3Cu_2O_x Superconductor
- Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope
- Scanning Tunneling Microscopy of Clean Silicon Surfaces at Elevated Temperatures
- Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy