Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
Unlike ultrahigh vacuum (UHV) scanning tunneling microscopy (STM), the effectiveness of UHV in UHV atomic force microscopy (AFM) has not been verified. Intensive interaction between tip and sample in UHV often damages the sample surface in the contact mode. Although noncontact (NC) AFM is effective in protecting the sample surface, it has failed to provide atomic-level resolution. We used a stiff silicon cantilever (〜40 N/m) capable of STM imaging, and succeeded in obtaining the first atomic-resolution images of Si(111)7×7 reconstruction in NC AFM at a tip-sample distance almost equal to that for STM imaging.
- 社団法人応用物理学会の論文
- 1995-01-15
著者
関連論文
- Atomic Force Microscopy Utilizing SubAngstrom Cantilever Amplitudes (特集1 プロダクションテクノロジー研究会)
- Scanning Tunneling Microscopy Observation of the Formation of the Smallest Dimer-Adatom-Stacking-fault Domain on a Quenched Si(111) Surface
- Detection of the flip-flop motion of buckled dimers on a Ge(001) surface by STM
- Little Influence of Kinks on the Formation of c(4×2)Domains in a Si(001)Surface at Low Temperature
- Scanning Tunneling Microscopy Observation of Ar-Ion-Bombarded Si(001) Surfaces and Regrowth Processes by Thermal Annealing
- Adsorption of Bismuth on Si(110) Surfaces Studied by Scanning Tunneling Microscopy
- Dynamic Observation of Ag Desorptiom Process onm Si(111) Surface by High-Termperature Scanning Tunneling Mieroscopy
- High-Temperature Scanning Tunneling Microscopy Observation of a (15, 17, 1) Facet Structure on a Si(110) Surface
- High-Temperature Scanning Tunneling Microscopy Study of the Phase Transition of 16-Structure Appearing on a Si(110) Surface
- Real-Time Observation of (1×1)-(7×7) Phase Transition on Vicinal Si(111) Surfaces by Scanning Tunneling Microscopy
- Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- AC Mode Feedback and Gate Pulse Acquisition Methods for Scanning Near-Field Optical Microscope
- Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves
- Low-Temperature Electron Microscopy of a Bi_2(Sr, Ca)_3Cu_2O_x Superconductor
- Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope
- Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy
- Scanning Tunneling Microscopy Study of the 16-Structure Appearing on a Si(110) Surface
- Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
- Observation of Silicon Surface Using Ultrahigh Vacuum Noncontact Atomic Force Microscope
- Scanning Tunneling Microscopy of Clean Silicon Surfaces at Elevated Temperatures
- AC Mode Feedback and Gate Pulse Acquisition Methods for Scanning Near-Field Optical Microscope
- Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy