AC Mode Feedback and Gate Pulse Acquisition Methods for Scanning Near-Field Optical Microscope
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-05-15
著者
関連論文
- Atomic Force Microscopy Utilizing SubAngstrom Cantilever Amplitudes (特集1 プロダクションテクノロジー研究会)
- Dynamic Observation of Ag Desorptiom Process onm Si(111) Surface by High-Termperature Scanning Tunneling Mieroscopy
- Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- AC Mode Feedback and Gate Pulse Acquisition Methods for Scanning Near-Field Optical Microscope
- Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope
- Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy
- Scanning Tunneling Microscopy Study of the 16-Structure Appearing on a Si(110) Surface
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
- AC Mode Feedback and Gate Pulse Acquisition Methods for Scanning Near-Field Optical Microscope