AC Mode Feedback and Gate Pulse Acquisition Methods for Scanning Near-Field Optical Microscope

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概要

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• A scanning near-field optical microscope (SNOM) with a nanometer-size aperture cantilever is a new powerful tool for investigating the optical characteristics of specimen surfaces. We applied the AC-mode feedback and gate pulse acquisition methods in illumination/reflection-mode SNOM. The application of the AC-mode feedback method increased the optical intensity of reflected light from two-to seven fold that obtained by the contact-mode feedback method. The use of the gate pulse acquisition method reduced optical imaging artifacts originating from the topographical features of surfaces.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-05-15

著者

• KITAMURA Shin-ichi

  JEOL Limited, Musashino

• NAKAMOTO Keiichi

  JEOL Ltd.

• Mooney Charles

  Jeol Usa

• Nakamoto Keiichi

  JEOL Ltd., 1-2 Musashino 3-Chome Akishima, Tokyo 196-8558, Japan

• Kitamura Shin-ichi

  JEOL Ltd., 1-2 Musashino 3-Chome Akishima, Tokyo 196-8558, Japan

• Mooney Charles

  JEOL USA, Inc. 11 Dearborn Road Peabody, MA 01960, USA

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