Photoreflectance Characterization of Ordered/Disordered GaAs_<0.5>Sb_<0.5> layers Grown on InP Substrates by Molecular Beam Epitaxy
スポンサーリンク
概要
- 論文の詳細を見る
- 2003-07-15
著者
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Ouchi Koichi
Research Institute For Advanced Science And Technology Osaka Prefecture University
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Kawamura Yuichi
Research Institute For Advanced Science And Technology Osaka Prefecture University
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INOUE Naohisa
Research Institute for Advanced Science and Technology, Osaka Prefecture University
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AMANO Masanobu
Research Institute for advanced Science and Technology, Osaka Prefecture University
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- Photoreflectance Characterization of Ordered/Disordered GaAs0.5Sb0.5 layers Grown on InP Substrates by Molecular Beam Epitaxy