スポンサーリンク
Ulsi Process Technology Development Center Matsushita Electronics Corporation | 論文
- Evidence of Anisotropic Diffusion of Indium Atoms on a Surface of Perylene-3,4,9,10-tetracarboxilic dianhydride/MoS_2 System Observed by Photoelectron Emission Microscopy (PEEM)
- A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission(Microelectronic Test Structures)
- A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs(Special Issue on Microelectronic Test Structures)
- Growth of CuPc Thin Films on Structured SiO_2/Si(100) Studied by Metastable Electron Emission Microscopy and Photoelectron Emission Microscopy
- Dynamics of Picosecond Laser-Generated Acoustic Waves in Solids : Photoacoustic Spectroscopy
- Surface Transformations in Glass Initiated by Laser-Driven Shock : High Power Ultrasonics
- A Highly Reliable MIM Technology with non-Crystallized HfOx Dielectrics Using Novel MOCVD Stacked TiN Bottom Electrodes
- Pt/Ba_xSr_TiO_3/Pt Capacitor Technology for 0.15μm Embedded Dynamic Random Access Memory
- Low Temperature BST-CVD Process for the Concave-Type Capacitors Designed for Logic-Base-Embedded DRAMs
- Extendibility of Ta_2O_5 Metal-Insulator-Metal Capacitor Using Ru Electrode
- Ru-Ta_2O_5MIM Capacitor toward 0.1μm DRAM Cell
- Ferroelectric Memory Circuit Technology and the Application to Contactless IC Card(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)
- Improved Metal Gate Process by Simultaneous Gate-Oxide Nitridation during W/WN_x Gate Formation
- Improved Metal Gate Process by Simultaneous Gate-Oxide Nitridation during W/WNx Gate Formation
- Surface Images of SiO_2/Si(100) Pattern using Electron Emission Microscopy with Metastable Atoms, Photons and Low-Energy Electrons
- Molecular Orientation and Aggregation of Titanyl Phthalocyanine Molecules on Graphite Substrates: Effects of Surface Topography of the Substrate
- Reaction at the Outermost Surface Selectively Induced by Metastable-Atom Beams
- Surface States of Hydrogen-terminated Si(111)by Metastable Atom Electron Spectroscopy and Angle-resolved Ultraviolet Photoelectron Spectroscopy
- Thickness-Dependent Orientation of the Pendant Phenyl Group at the Surface of Polystyrene Thin Films
- Low-Energy Electron Transmission Spectroscopy of Thin Films of Chloroaluminum Phthalocyanine on MoS_2