スポンサーリンク
Toyota Central Research and Development Labs | 論文
- Thermally Induced Structural Modification of Nanometer-Order Mo/Si Multilayers by the Spectral Reflectance of Laser-Plasma Soft X-Rays
- Single-Shot Measurement of Spectral Reflectance of a Soft X-Ray Multilayer Mirror Using a Laser-Plasma X-Ray Source
- Plasma-Wall Interactions in Dual Frequency Narrow-Gap Reactive Ion Etching System
- Internal Stress of CoSi_2 Films Formed by Rapid Thermal Annealing
- Stress Measurements in Silicon Substrates with TiSi_2 Patterns Using Raman Microprobe
- Measurements of Reflection Coefficient of Ion Waves in an Ion Beam-Plasma System
- Waveform of Linear Ion-Acoustic Waves Excited by a Mesh Grid
- Reflection of Ion Waves from a Bipolar Electrode in an Ion Beam-Plasma System
- X-Ray Mask Distortion Induced in Back-Etching Preceding Subtractive Fabrication: Resist and Absorber Stress Effect
- Reduction of X-Ray Irradiation-Induced Pattern Displacement of SiN Membranes Usirng H^+ Ion Implantation Technique
- CF and CF_2 Radical Densities in 13.56-MHz CHF_3/Ar Inductively Coupled Plasma(Nuclear Science, Plasmas, and Electric Discharges)
- Superconducting and Magnetic Properties of the High-T_c and High-Density Superconductor Y_Lu_xBa_2Cu_3O_ : Electrical Properties Condensed Matter
- Electrical, Magnetic and Superconducting Properties of the High-T_c Superconductor Er_Yb_xBa_2Cu_3O_
- Improvement in Radiation Stability of SiN X-Ray Mask Membranes
- A ^7Li-NMR Study on Spinel LiMn_2O_4 : the Evidence of an Aniferromanetic Transition at 〜40K
- Observation of Polymer Alloy by Spectral Soft X-Ray Microscopy with Laser Plasma X-Ray Source
- Lattice Location of ^N Atoms in SiC Analyzed by Nuclear Resonant Reaction
- Laser Plasma Soft X-Ray Contact Microscopy of Polyrmer Composites
- Structure Analysis of Nylon6-Clay Hybrid by Spectral Reflectance of Laser-Plasma Soft X-Rays
- Structure and Superconductivity of Sputtered Bi-Sr-Ca-Cu-O Films from Various Targets