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Sortec Corporation | 論文
- Effects of Hg Annealing on Photoluminescence Spectra of CdTe Crystals and MOCVD-Grown CdTe/GaAs Films
- Performance of a 600 Mbyte 90 mm Phase-Change Optical Disk against Disk Tilt
- Mechanism of Resist Pattern Collapse during Development Process
- 60GHz mixer MMIC for millimeter wave radar
- Critical Layer Thickness of n-In_Al_AS/In_Ga_As/In_Al_AS Pseudomorphic Heterostructures Studied by Photoluminescence
- Fabrication and Illuminance Properties of Phosphor-conversion Green Light-emitting Diode with a Luminous Efficacy over 100 lm/W
- Exciton Binding Energy under Electric Field in ZnTe1-xSx/ZnS Strained-Layer Superlattices
- Valence Band Structure and Optical Gain in Cd_xZn_/ZnS Quantum Wells : Short Note
- Dynamic Oscillation Modes Caused by a Pulsed X-Ray Exposure in an X-Ray Mask Membrane
- Dynamic Oscillation Modes Caused by a PulsedX-Ray Exposure in an X-Ray Mask Membrane : X-Ray Lithography
- Dynamic Thermal Distortions in an X-ray Mask Membrane During Pulsed X-Ray Exposure : Lithography Technology
- Dynamic Thermal Distortions in an X-ray Mask Membrane During Pulsed X-Ray Exposure
- Synchrotron Radiation Damage Mechanism of X-Ray Mask Membranes Irradiated in Helium Environment
- Down to 0.1 μm Pattern Replication in Synchrotron Radiation Lithography
- Sub-0.1μm Patterning with High Aspect Ratio of 5 Achieved by Preventing Pattern Collapse
- A Method to Compensate Decay of Power in SR Lithography