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SII Nanotechnology Inc. | 論文
- Partial Structural Functions of Molten CuBr Estimated from the Anomalous X-Ray Scattering Measurements
- Transport Properties of Superionic Conducting Glasses (AgX)_(Ag_2O)_(GeO_2)_ (X=I, Br, Cl)
- Partial Structural Functions of Molten RbBr Estimated from the Anomalous X-ray Scattering Data (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))
- Structure and Effective Pair Potentials of Molten CuBr Estimated from the Anomalous X-ray Scattering Measurements
- Evaluation of fluorinated diamond like carbon as antisticking layer by scanning probe microscopy
- Investigating Line-Edge Roughness in Calixarene Fine Patterns Using Fourier Analysis
- Mechanism of Layer-by-Layer Oxidation of Si(001)Surfaces by Two-Dimensional Oxide-Island Nucleation at SiO_2/Si Interfaces
- Mechanism of Layer-by-Layer Oxidation of Si (001) Surfaces Proceeding by Two-Dimensional Oxide-Island Nucleation at SiO_2/Si Interfaces
- Change in the Layered Structure of Merocyanine Dye Langmuir-Blodgett Films due to N-Octadecane Addition
- Surface Morphology of Diamond-Like Carbon Film and Si Wafer Milled with 30 keV Gallium Focused Ion Beam
- Deposition Yield and Physical Properties of Carbon Films Deposited by Focused-Ion-Beam Chemical Vapor Deposition
- √-Variation of AC Admittance inthe Inhomogeneously Distributed RC Lines
- Simulation of Fractal Immittance by Analog Circuits: An Approach to the Optimized Circuits
- Microscopic Observation of Nanofibers and Helical Nanoribbons Composed of Tetraether Cyclobolaphile
- Nanostructure Fabrication Based on Sporntaneous Formation Mechanisms
- Observation of Superconducting Device Using Magnetic Imaging System with a Micro-DC Superconducting Quantum Interference Device Magnetometer
- Post-thinning technique for a lifted-out membrane
- Temperature Dependence of Release Effect for Antisticking Layer in Nanoimprint Characterized by Scanning Probe Microscopy
- Examination of Focused-Ion-Beam Repair Resolution for UV-Nanoimprint Templates
- Eduction Position Control of Incorporated Gallium in Diamond-Like Carbon Deposited by Focused-Ion-Beam Chemical Vapor Deposition