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SII Nanotechnology Inc. | 論文
- Relationship between Field Emission Properties and Material Characteristics of Diamond-Like Carbon Fabricated by Focused-Ion-Beam Chemical Vapor Deposition
- Identification of Size Differences of Gold Nanoparticles on Cell Surface by Curvature Reconstruction Method Using Atomic Force Microscopy
- Observations of Single Magnetic Domain Wall in Nanomagnet by Magnetic Force Microscopy
- Nanoimprint Mold Repair by Ga+ Focused-Ion-Beam Direct Etching
- Characteristics of Nano-Electrostatic Actuator Fabricated by Focused Ion Beam Chemical Vapor Deposition
- High-Precision Quadrupole Correction Lens for Ion-Beam Focusing : Design and Test of Multistage Self-Aligned Quadrupole Correction-Lens System
- Selective Backscattered Electron Imaging of Material and Channeling Contrast in Microstructures of Scale on Low Carbon Steel Controlled by Accelerating Voltage and Take-off Angle
- Microscopic Observation of Nanofibers and Helical Nanoribbons Composed of Tetraether Cyclobolaphile