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Ricoh Co. Ltd. Miyagi Jpn | 論文
- Fabrication and Electrical Characteristics of Single Electron Tunneling Devices Based on Si Quantum Dots Prepared by Plasma Processing ( Quantum Dot Structures)
- Electronic structure of octane on Cu(111) and Ni(111) studied by near edge X-ray absorption fine structure
- Growth of nanographite on Pt(111) and its edge state
- Metal-induced gap states in epitaxial organic-insulator/metal interfaces
- Energy Dispersive Near Edge X-Ray Absorption Fine Structure in the Soft X-Ray Region: A New Technique to Investigate Surface Reactions
- Fabrication of Nanocrystalline Silicon with Small Spread of Particle Size by Pulsed Gas Plasma ( Quantum Dot Structures)
- Effect of Native Oxide upon Formation of Amorphous SiO_x Layer at the Interface of Directly Bonded Silicon Wafers
- Exciton-Related Photoluminescence in 4H-SiC Growm by Step-Controlled Epitaxy
- Step-Controlled Epitaxial Growth of 4H-SiC and Doping of Ga as a Blue Luminescent Center
- Application of Reversed Silicon Wafer Direct Bonding to Thin-Film SOI Power ICs
- Application of Reversed Silicon Wafer Direct Bonding to Thin-Film SOI Power Ics
- Analysis of Short-Channel Schottky Source/Drain Metal-Oxide-Semiconductor Field-Effect Transistor on Silicon-on-Insulator Substrate and Demonstration of Sub-50-nm n-type Devices with Metal Gate
- Scanning Tunneling Spectroscopy Study of Fe(001) Using Nonmagnetic W- and Fe-Evaporated Probe Tips
- 35 nm Metal Gate p-type Metal Oxide Semiconductor Field-Effect Transistor with PtSi Schottky Source/Drain on Separation by Implanted Oxygen Substrate
- Element-Specific Image and Local Work Function of Fe Submonolayer Film on Au (001) Studied by Scanning Tunneling Microscopy
- Fabrication and Characteristics of a Field Effect Transistor Using CdF_2/CaF_2 Heterostructures on a Si Substrate
- Scanning Tunneling Microscopy Study of Fe Submonolayer Film on Vicinal Au(001)
- Photoresist Chemical Mechanical Polishing for Shallow Trench Isolation
- Photoresist CMP for Shallow Trench Isolation
- Three Dimensional Optical Emission Tomography of an Inductively Coupled Plasma