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NTT LSI laboratories | 論文
- A 4:1 MUX Circuit Using 1/4 Micron CMOS/SIMOX for High-Speed and Low-Power Applications
- 3-Gb/s CMOS 1:4 MUX and DEMUX ICs
- A Low-Power and High-Speed Impulse-Transmission CMOS Interface Circuit
- Mask Contamination Induced by X-Ray Exposure
- The Behavior of Alkoxy-Functional Groups on Atmospheric-Pressure Chemical Vapor Deposition Using Alkoxysilane and Ozone
- Characteristics of Silicon Dioxide Film Prepared by Atmospheric-Pressure Chemical Vapor Deposition Using Tetraethoxysilane and Ozone with Alcohol Addition
- Study of HF-Treated Heavily-Doped Si Surface Using Contact Angle Measurements
- Effect of Added Ethanol in Atmospheric-Pressure Chemical Vapor Deposition Reaction Using Tetraethoxysilane and Ozone
- Investigation of Buffer Iayer of Cubic GaN Epitaxial Films on (100)GaAs Grown by Metalorganic-Hydrogen Chloride Vapor-Phase Epitaxy
- New Epitaxial Growth Method of Cubic GaN on (100) GaAs Using (CH_3)_3Ga, HCl and NH_3
- Electron Velocity Overshoot Effect in Collector Depletion Layers of InP/InGaAs Heterojunction Bipolar Transistors
- Transport Mechanism of Interfacial Network Forming Atoms during Silicon Oxidation
- LSI Applications of 0.25-μm CMOS/SIMOX Technology
- Diffusion and Segregation of Nitrogen in Polycrystalline Silicon and at the Poly-Si/SiO_2 Interface
- Behavior of Alkoxy-Functional Groups on Atmospheric-Pressure Chemical Vapor Deposition Using Alkoxysilane and Ozone
- Study of a Veil Structure and a Two-Step Corrosion Suppression Process in Al-Si-Cu Etching
- Asynchronous Transfer Mode Switching LSI Chips with 10-Gb/s Serial I/O Ports(Special Issue on the 1994 VLSI Circuits Symposium)
- Quantum Mechanical Influence on Flat-Band Capacitance for Metal-Oxide-Semiconductor Structures with Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy